March, 2008
Through Silicon Via Test Wafers
300mm BDIIx Porous Ultra Low k Films Available Now
December, 2007
Silyb adds Plasma Damage Wafers to the line up!
November, 2007
Silyb 300mm Metrology Services growing worldwide
October, 2007
4x lower Defects with Silyb 300mm Cu Patterns!
August, 2007
300mm SACVD and HDP 864 STI Patterned Wafers
300mm TEOS Capped Black Diamond MIT854's
300mm Low Cost Cu MIT854 Patterned Wafers
January, 2007
Advance Contact Test Wafer for W and Poly Si
Silyb Customer Support Goes Above and Beyond
Silyb Introduces Low Cost Cu/Low k (Black Diamond) and Cu/TEOS Patterned Wafers
December, 2006
A 200mm 90nm Cu/Low k Fab at your Fingertips
January, 2005
Silyb Introduces Advanced STI Characterization Wafer