1213KDZA: 8kA CVD W

8kA CVD W on 250A Ti on 1kA Pad Ox on 300mm Si

  • High quality CVD W films for your CMP studies.

S754WOX: MIT754 W/Oxide Test Wafers

Industry leading defectivity. Improve your chances of qualification by using the lowest defect test wafers available

  • 45nm IC Fab manufactured MIT754 W patterned test wafers.
  • 4x lower defects versus other available 300mm W Patterned wafers