300mm Metrology Services

Please Inquire about 300mm Metrology Services

300mm Metrology Services available, please inquire for more information.

AITxp with SEM review on Patterned Wafers

300mm Defect Capture and Review on Cu, W or STI wafers. Report with 50 classified optical and SEM images included.

• EDX chemical constituent analysis available
• Atomic Force Microscope (AFM) defect morphology analysis available.

Thin Film Measurement

KLA F5x measurement services

• Provides correlation, qualification or general thin film measurement support