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SJ085WTEOS

160nm W Advanced Contact Wafers

  • Device Manufacturer Test Chip Design
  • Multiple Areas to investigate CMP, Etch, or Lithography

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SK194WTEOS: W/TEOS 90nm Advanced Interconnect Patterned Wafer

120nm minimum feature W Interconnect Characterization Wafer with TEOS ILD.

  • TEOS ILD

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