8kA CVD W on 250A Ti on 1kA Pad Ox on 300mm Si
- High quality CVD W films for your CMP studies.
Industry leading defectivity. Improve your chances of qualification by using the lowest defect test wafers available
- 45nm IC Fab manufactured MIT754 W patterned test wafers.
- 4x lower defects versus other available 300mm W Patterned wafers